Non-volatile Memory Reliability

  1. Cycling Endurance Test (CET): Erase and program non-volatile memory for given number of times under high and normal temperature conditions to test its capacity against wear by repeated write-in and read-out operations.
  2. Data Retention Test: Save data in non-volatile memory element before retrieving them under conditions of high temperature by baking and normal temperature to validate its data retention capacity.

test condition

Follow JESD 47 Table 1a
Follow JESD 47 Table 1a

Failure model

   1. Cycling Endurance Test

  • Failed to erase/program the non-volatile memory for number of times given in its datasheet
  • Failed to erase/program the non-volatile memory in number of times given in its datasheet

    2. Data Retention Test

  • Failed to reach data retention time given in datasheet of the non-volatile memory
  • Error of data saved in the non-volatile memory due to loss of charge or capacitive coupling failure

 

 

  • Automotive, consumer electronic, commercial, industrial

Applicated industry

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