What we can do
Based on its long and profound experience, iST is able to provide the optimum decapping method specific to individual packaged IC to prepare for easy testing. See below for some of the techniques we offer. Please contact us for more details.
LED, gallium arsenide IC, automotive IC, optical coupling IC
backside, MEMS, packaging material preparation, various kinds of packaging removal
Chemical etching analysis
crater test, solder oil / stain removal, photo resistance removal by chemical etching, pin cleaning
What will need IC decapsulation
IC failure analysis may require looking into chips, wires, and devices which do not allow for observation of their internal parts because of the package covering outside. The external layers blocking observation may be removed by “dry etching” and “wet etching” to uncover the devices packaged inside for treatment and observation during testing.
The Superiority Of LF
- Comprehensive experience-based assessments ensuring more successful tests later
- Rich industry experience which ensures integrity of your samples
- PSolid service team which ensures your requirements can be met
In spite of there being scores of packaging types, iST has adequate experience in dealing with any one of them.
Gallium arsenide IC