“Use Surce Measurement Unit(SMU) to provide voltage or current to verify and measure semiconductor device characteristics (e.g., Diode I-V and MOSFET characteristics curves)”
Pinpoint Leakage Current Point of MIM Capacitor in Five Steps
what can we do
Lab First may assist verify and measure parameters and characteristics of semiconductor electronic devices, e.g. capacitance-voltage(C-V), voltage-current (I-V), resistance(R), capacitance(C), inductance(L) and signal waveform, to identify causes of devices failure for later analysis.
The Superiority Of LF
The Superiority of LF
The Superiority of LF
Easy and fast
Diversified equipment optional for different requirements
SMU with support of high resolution up to 10 fA
Measuring different types of packaging together with probe pad