i-v curve measurement

“Verify and measure semiconductor device characteristics (e.g., Diode I-V and MOSFET characteristics curves) with voltages or currents provided by a source measurement unit (SMU).”

what can we do

Lab First  may assist verify and measure parameters and characteristics of semiconductor electronic devices, e.g. capacitance-voltage(C-V), voltage-current (I-V), resistance(R), capacitance(C), inductance(L) and signal waveform, to identify causes of devices failure for later analysis.

The Superiority Of LF

CASE SHARING

Example of I-V Curve

  • DC and semiconductor components characterization
  • Electrical failure analysis (EFA
  • Assistant in subsequent electrical measurements (Force V Measure I / Force I Measure V).
  • Keysight B1500A
  • Keithley 4200
  • Keithley 2450
  • HP 4156A 
  • C-V Maximum Voltage: 25V, Maximum Frequency: 5 MHz.
  • I-V Maximum 4 Channel; Maximum Voltage: 200 V、Maximum I.: 1A; Power:20 W.

Why Choose Lab First


One-stop service (chemical analysis/failure analysis/material analysis)

Precise and quantitative analysis

Full experimental data interpretation

LAB FIRST IS YOUR FIRST CHOICE

Ready to pursue your goal