Atomic Force Microscopy (AFM)
What is AFM
AFM gives atom-scale resolution, forming a key means for studying surface of micro structures.
The main principle of AFM is to cause a micro displacement of the cantilever (which carries the probe) using the atomic forces between the probe tip and the sample, to map the topography of the sample. AFM is applicable to various material surface inspections.
The Superiority Of LF
- Membrane Roughness Tests
- Structural Study Of Micro Surfaces
- 2D/3D Material Surface Topography
- Nanoscale Step Height Analysis