Scanning Electron Microscope (SEM)

What we can do

Because the SEM has high resolution, the maximum magnification can reach over 100,000 times, and large depth of field, its primary use is in observing sample surface and cross section micro structure.

When the SEM tool is equipped with an Energy Dispersive Spectrometer (EDS), it can also be used to provide micro (region) material analysis of the sample surface. This includes qualitative, semi-qualitative element analysis and specific regional analysis of point, line scan & mapping.

What is SEM?

The Scanning Electron Microscope (SEM) uses optoelectronic system to focus electrons generated by an electronic gun onto a small spot on the sample surface. This beam of electrons will then interact with the sample material to generate secondary electrons, back scatter and signature X-Ray etc. A scan coil is then placed on sample surface to pick up those signals. The SEM works by collecting secondary electrons to form an image.

The Superiority Of LF

Equipment Capacity

FEI verios460L

Electron gun

Schottky FE

Resolution

0.6nm (accelerating voltage 15kV) ,0.7nm(accelerating voltage 1kV)

Magnification

45~800k

Accelerating voltage

0.5~30kV

HITACHI SU8020

Electron gun

Cold FE

Resolution

1.0nm (accelerating voltage15kV) ,1.3nm(accelerating voltage 1kV)

Magnification

30~800k

Accelerating voltage

0.1~30kV

HITACHI SU8220

Electron gun

Cold FE

Resolution

0.8nm (accelerating voltage15kV) ,1.1nm(accelerating voltage1kV)

Magnification

20~1000k (vary with WD, HV)

Accelerating voltage

0.01~30kV

JEOL 6700-F

Electron gun

Cold FE

Resolution

1.0nm (accelerating voltage 15kV) ,2.2nm(accelerating voltage 1kV)

Magnification

25~650k

Accelerating voltage

0.5~30kV

Case Sharing

Why Choose Lab First


EXPERTS team

Joint diagnostics Service

Perfect Advanced Equipment

LAB FIRST IS YOUR FIRST CHOICE

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